| Electronic component: | Description: | Manuf. | Package | Pins | T°min | T°max | Datasheet |
|---|
| 5962-9172501M3A | SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES | Texas-Instruments | FK | 28 | -55°C | 125°C | 294 K |
| 5962-9172601M3A | SCAN TEST DEVICES WITH OCTAL BUFFERS | Texas-Instruments | FK | 28 | -55°C | 125°C | 293 K |
| 5962-9172601M3A | SCAN TEST DEVICES WITH OCTAL BUFFERS | Texas-Instruments | FK | 28 | -55°C | 125°C | 293 K |
| 5962-9172701Q3A | SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS | Texas-Instruments | FK | 28 | -55°C | 125°C | 294 K |
| 5962-9172801Q3A | SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS | Texas-Instruments | FK | 28 | -55°C | 125°C | 309 K |
| JM38510/17203BCA | CMOS QUAD EXCLUSIVE-OR GATE | Texas-Instruments | J | 14 | -55°C | 125°C | 68 K |
| MC33172D | Low Power, Single Supply Operational Amplifier | ON-Semiconductor | SOIC | 8 | - | - | 217 K |
| MC33172DR2 | Low Power, Single Supply Operational Amplifier | ON-Semiconductor | SOIC | 8 | - | - | 217 K |
| MC33172P | Low Power, Single Supply Operational Amplifier | ON-Semiconductor | PDIP | 8 | - | - | 217 K |
| UC1724J883B | ISOLATED DRIVE TRANSMITTER | Texas-Instruments | - | 8 | -55°C | 125°C | 264 K |
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