Electronic component: | Description: | Manuf. | Package | Pins | T°min | T°max | Datasheet |
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IDT71V35761S200BG | 128K x 36, 3.3V synchronous SRAM burst counter, single cycle deselect, 200MHz | Integrated-Device-Technology-Inc- | BGA | 119 | 0°C | 70°C | 282 K |
IDT71V35761S200BQ | 128K x 36, 3.3V synchronous SRAM burst counter, single cycle deselect, 200MHz | Integrated-Device-Technology-Inc- | FBGA | 165 | 0°C | 70°C | 282 K |
IDT71V35761S200BQ | 128K x 36, 3.3V synchronous SRAM burst counter, single cycle deselect, 200MHz | Integrated-Device-Technology-Inc- | FBGA | 165 | 0°C | 70°C | 282 K |
IDT71V35761S200PF | 128K x 36, 3.3V synchronous SRAM burst counter, single cycle deselect, 200MHz | Integrated-Device-Technology-Inc- | TQFP | 100 | 0°C | 70°C | 282 K |
IDT71V35781S200BG | 256K x 18, 3.3V synchronous SRAM burst counter, single cycle deselect, 200MHz | Integrated-Device-Technology-Inc- | BGA | 119 | 0°C | 70°C | 282 K |
IDT71V35781S200BQ | 256K x 18, 3.3V synchronous SRAM burst counter, single cycle deselect, 200MHz | Integrated-Device-Technology-Inc- | FBGA | 165 | 0°C | 70°C | 282 K |
IDT71V35781S200PF | 256K x 18, 3.3V synchronous SRAM burst counter, single cycle deselect, 200MHz | Integrated-Device-Technology-Inc- | TQFP | 100 | 0°C | 70°C | 282 K |
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