Electronic component: | Description: | Manuf. | Package | Pins | T°min | T°max | Datasheet |
---|
5962-9318601M3A | SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS | Texas-Instruments | FK | 28 | -55°C | 125°C | 342 K |
5962-9318601MLA | SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS | Texas-Instruments | JT | 24 | -55°C | 125°C | 342 K |
5962-9461501Q3A | SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANCEIVERS | Texas-Instruments | FK | 28 | -55°C | 125°C | 357 K |
5962-9461501QXA | SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANCEIVERS | Texas-Instruments | JT | 28 | -55°C | 125°C | 357 K |
SN74GTL16612ADLR | 18-BIT LVTTL-TO-GTL/GTLPLUS UNIVERSAL BUS TRANSCEIVERS | Texas-Instruments | DL | 56 | -40°C | 85°C | 203 K |
SNJ54ABT8245FK | SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS | Texas-Instruments | FK | 28 | -55°C | 125°C | 342 K |
SNJ54ABT8245JT | SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS | Texas-Instruments | JT | 24 | -55°C | 125°C | 342 K |
SNJ54ABTH18502AHV | SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS | Texas-Instruments | HV | 68 | -55°C | 125°C | 549 K |
SNJ54BCT8240AFK | SCAN TEST DEVICES WITH OCTAL BUFFERS | Texas-Instruments | FK | 28 | -55°C | 125°C | 293 K |
SNJ54BCT8240AFK | SCAN TEST DEVICES WITH OCTAL BUFFERS | Texas-Instruments | FK | 28 | -55°C | 125°C | 293 K |
SNJ54BCT8240AFK | SCAN TEST DEVICES WITH OCTAL BUFFERS | Texas-Instruments | FK | 28 | -55°C | 125°C | 293 K |
SNJ54BCT8240AFK | SCAN TEST DEVICES WITH OCTAL BUFFERS | Texas-Instruments | FK | 28 | -55°C | 125°C | 293 K |
<< [2209] [2210] [2211] [2212] [2213] 2214 [2215] [2216] [2217] [2218] [2219] >> |
---|