Electronic component: | Description: | Manuf. | Package | Pins | T°min | T°max | Datasheet |
---|
HD74LVC16244A | 16-bit Buffers/Line Drivers with 3-state non-inverted outputs | distributor | - | - | - | - | 50 K |
HD74LVC244A | Octal Buffers/Line Drivers/Line Receivers with non-inverted 3-state outputs | distributor | - | - | - | - | 47 K |
HD74LVCZ16244A | 16-bit Buffers/Line Drivers/Line Receivers with non-inverted 3-state outputs (live insertion) | distributor | - | - | - | - | 53 K |
HD74LVCZ244A | Octal Buffers/Line Drivers/Line Receivers with non-inverted 3-state outputs (live insertion) | distributor | - | - | - | - | 56 K |
SN74BCT8244ADW | IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL BUFFERS | Texas-Instruments | DW | 24 | 0°C | 70°C | 293 K |
SN74BCT8244ADWR | IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL BUFFERS | Texas-Instruments | DW | 24 | 0°C | 70°C | 293 K |
SN74BCT8244ANT | IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL BUFFERS | Texas-Instruments | NT | 24 | 0°C | 70°C | 293 K |
SN74LVTH244APWR | 3.3-V ABT OCTAL BUFFERS/DRIVERS WITH 3-STATE OUTPUTS | Texas-Instruments | PW | 20 | -40°C | 85°C | 93 K |
SNJ54BCT8244AFK | SCAN TEST DEVICES WITH OCTAL BUFFERS | Texas-Instruments | FK | 28 | -55°C | 125°C | 293 K |
SNJ54BCT8244AJT | SCAN TEST DEVICES WITH OCTAL BUFFERS | Texas-Instruments | JT | 24 | -55°C | 125°C | 293 K |
<< [15] [16] [17] [18] [19] 20 [21] [22] [23] [24] [25] >> |
---|