| Electronic component: | Description: | Manuf. | Package | Pins | T°min | T°max | Datasheet |
|---|
| HD74LVC16245A | 16-bit Bus Transceivers with 3-state non-inverted outputs | distributor | - | - | - | - | 56 K |
| HD74LVC245A | Octal Bus Transceivers with 3-state outputs | distributor | - | - | - | - | 51 K |
| HD74LVCZ245A | Octal Bus Transceivers with 3-state outputs (live insertion) | distributor | - | - | - | - | 58 K |
| SN74ABT18245ADGGR | SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS | Texas-Instruments | DGG | 56 | -40°C | 85°C | 357 K |
| SN74ABT18245ADL | SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS | Texas-Instruments | DL | 56 | -40°C | 85°C | 357 K |
| SN74ABT18245ADLR | SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS | Texas-Instruments | DL | 56 | -40°C | 85°C | 357 K |
| SN74BCT8245ADW | IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL BUS TRANSCEIVERS | Texas-Instruments | DW | 24 | 0°C | 70°C | 309 K |
| SN74BCT8245ADWR | IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL BUS TRANSCEIVERS | Texas-Instruments | DW | 24 | 0°C | 70°C | 309 K |
| SN74BCT8245ANT | IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL BUS TRANSCEIVERS | Texas-Instruments | NT | 24 | 0°C | 70°C | 309 K |
| SNJ54BCT8245AJT | SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS | Texas-Instruments | JT | 24 | -55°C | 125°C | 309 K |
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