| Electronic component: | Description: | Manuf. | Package | Pins | T°min | T°max | Datasheet |
|---|
| CY74FCT2646CTQC | OCTAL REGISTERED BUS TRANSCEIVERS WITH 3-STATE OUTPUTS AND SERIES OUTPUT RESISTORS | Texas-Instruments | DBQ | 24 | -40°C | 85°C | 51 K |
| CY74FCT2646CTQCT | OCTAL REGISTERED BUS TRANSCEIVERS WITH 3-STATE OUTPUTS AND SERIES OUTPUT RESISTORS | Texas-Instruments | DBQ | 24 | -40°C | 85°C | 51 K |
| IDT74FCT162646ATE | Fast CMOS 16-bit bus transceiver/registers (3-state) | Integrated-Device-Technology-Inc- | - | 56 | -40°C | 85°C | 177 K |
| IDT74FCT162646ATEB | Fast CMOS 16-bit bus transceiver/registers (3-state) | Integrated-Device-Technology-Inc- | - | 56 | -40°C | 85°C | 177 K |
| IDT74FCT162646CTE | Fast CMOS 16-bit bus transceiver/registers (3-state) | Integrated-Device-Technology-Inc- | - | 56 | -40°C | 85°C | 177 K |
| IDT74FCT162646CTEB | Fast CMOS 16-bit bus transceiver/registers (3-state) | Integrated-Device-Technology-Inc- | - | 56 | -40°C | 85°C | 177 K |
| IDT74FCT162646ETE | Fast CMOS 16-bit bus transceiver/registers (3-state) | Integrated-Device-Technology-Inc- | - | 56 | -40°C | 85°C | 177 K |
| IDT74FCT162646ETEB | Fast CMOS 16-bit bus transceiver/registers (3-state) | Integrated-Device-Technology-Inc- | - | 56 | -40°C | 85°C | 177 K |
| SN74ABTH182646APM | SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS | Texas-Instruments | PM | 64 | -40°C | 85°C | 559 K |
| SN74LVTH182646APM | 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS | Texas-Instruments | PM | 64 | -40°C | 85°C | 551 K |
| [1] [2] 3 [4] [5] [6] [7] [8] [9] [10] |
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