| Electronic component: | Description: | Manuf. | Package | Pins | T°min | T°max | Datasheet |
|---|
| 5962-9318601M3A | SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS | Texas-Instruments | FK | 28 | -55°C | 125°C | 342 K |
| 5962-9318601MLA | SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS | Texas-Instruments | JT | 24 | -55°C | 125°C | 342 K |
| SN74ABT8543DLR | SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANSCEIVERS | Texas-Instruments | DL | 28 | -40°C | 85°C | 357 K |
| SN74ABT8543DWR | SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANSCEIVERS | Texas-Instruments | DW | 28 | -40°C | 85°C | 357 K |
| SN74BCT8373ADW | IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL D-TYPE LATCHES | Texas-Instruments | DW | 24 | 0°C | 70°C | 294 K |
| SN74GTLP1394DR | 2-BIT LVTTL-TO-GTLP ADJUSTABLE EDGE-RATE BUS TRANSCEIVER W/ SELECTABLE POLARITY | Texas-Instruments | D | 16 | -40°C | 85°C | 143 K |
| SNJ54BCT8373AFK | SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES | Texas-Instruments | FK | 28 | -55°C | 125°C | 294 K |
| SNJ54BCT8373AJT | SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES | Texas-Instruments | JT | 24 | -55°C | 125°C | 294 K |
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