| Electronic component: | Description: | Manuf. | Package | Pins | T°min | T°max | Datasheet |
|---|
| BC373RL1 | Darlington Transistor NPN | ON-Semiconductor | - | 3 | - | - | 107 K |
| BC373RL1 | Darlington Transistor NPN | ON-Semiconductor | - | 3 | - | - | 107 K |
| HD74BC373A | Octal D-type Transparent Latches with 3-state output | distributor | - | - | - | - | 41 K |
| HD74LV373A | Octal D-type Transparent Latches with 3-state output | distributor | - | - | - | - | 69 K |
| HD74LVC16373A | 16-bit D-type Transparent Latches with 3-state outputs | distributor | - | - | - | - | 56 K |
| HD74LVC16373A | 16-bit D-type Transparent Latches with 3-state outputs | distributor | - | - | - | - | 56 K |
| HD74LVC373A | Octal D-type Transparent Latches with noninverted 3-state outputs | distributor | - | - | - | - | 50 K |
| SN74BCT8373ADW | IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL D-TYPE LATCHES | Texas-Instruments | DW | 24 | 0°C | 70°C | 294 K |
| SN74BCT8373ADWR | IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL D-TYPE LATCHES | Texas-Instruments | DW | 24 | 0°C | 70°C | 294 K |
| SN74BCT8373ANT | IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL D-TYPE LATCHES | Texas-Instruments | NT | 24 | 0°C | 70°C | 294 K |
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