Electronic component: | Description: | Manuf. | Package | Pins | T°min | T°max | Datasheet |
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SN74BCT8374ADW | SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS | Texas-Instruments | DW | 24 | 0°C | 70°C | 294 K |
SN74BCT8374ADWR | SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS | Texas-Instruments | DW | 24 | 0°C | 70°C | 294 K |
SN74BCT8374ADWR | SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS | Texas-Instruments | DW | 24 | 0°C | 70°C | 294 K |
SN74BCT8374ANT | SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS | Texas-Instruments | NT | 24 | 0°C | 70°C | 294 K |
SN74BCT8374ANT | SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS | Texas-Instruments | NT | 24 | 0°C | 70°C | 294 K |
TLC374IN | QUAD GENERAL PURPOSE LINCMOS(TM) DIFFERENTIAL COMPARATOR | Texas-Instruments | N | 14 | - | - | 268 K |
TLC374MD | QUAD GENERAL PURPOSE LINCMOS(TM) DIFFERENTIAL COMPARATOR | Texas-Instruments | D | 14 | -55°C | 125°C | 268 K |
TLC374MFKB | QUAD GENERAL PURPOSE LINCMOS(TM) DIFFERENTIAL COMPARATOR | Texas-Instruments | FK | 20 | -55°C | 125°C | 268 K |
TLC374MJ | QUAD GENERAL PURPOSE LINCMOS(TM) DIFFERENTIAL COMPARATOR | Texas-Instruments | J | 14 | -55°C | 125°C | 268 K |
TLC374MJB | QUAD GENERAL PURPOSE LINCMOS(TM) DIFFERENTIAL COMPARATOR | Texas-Instruments | J | 14 | -55°C | 125°C | 268 K |
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