| Electronic component: | Description: | Manuf. | Package | Pins | T°min | T°max | Datasheet |
|---|
| MC74HC240AF | Octal With 3-State Outputs Inverting Buffer/Line Driver/Line Receiver | ON-Semiconductor | TSSOP | 20 | - | - | 180 K |
| MC74HC240AFEL | Octal With 3-State Outputs Inverting Buffer/Line Driver/Line Receiver | ON-Semiconductor | TSSOP | 20 | - | - | 180 K |
| MC74HC240AFL1 | Octal With 3-State Outputs Inverting Buffer/Line Driver/Line Receiver | ON-Semiconductor | TSSOP | 20 | - | - | 180 K |
| MC74HC240AFL2 | Octal With 3-State Outputs Inverting Buffer/Line Driver/Line Receiver | ON-Semiconductor | TSSOP | 20 | - | - | 180 K |
| MC74HC4040AF | 12-Stage Binary Ripple Counter | ON-Semiconductor | MFP | 16 | - | - | 170 K |
| MC74HC4040AFEL | 12-Stage Binary Ripple Counter | ON-Semiconductor | MFP | 16 | - | - | 170 K |
| MC74HC4040AFL1 | 12-Stage Binary Ripple Counter | ON-Semiconductor | MFP | 16 | - | - | 170 K |
| MC74HC4040AFR1 | 12-Stage Binary Ripple Counter | ON-Semiconductor | MFP | 16 | - | - | 170 K |
| MC74HC4040AFR2 | 12-Stage Binary Ripple Counter | ON-Semiconductor | MFP | 16 | - | - | 170 K |
| SNJ54BCT8240AFK | SCAN TEST DEVICES WITH OCTAL BUFFERS | Texas-Instruments | FK | 28 | -55°C | 125°C | 293 K |
| SNJ54BCT8240AFK | SCAN TEST DEVICES WITH OCTAL BUFFERS | Texas-Instruments | FK | 28 | -55°C | 125°C | 293 K |
| SNJ54BCT8240AFK | SCAN TEST DEVICES WITH OCTAL BUFFERS | Texas-Instruments | FK | 28 | -55°C | 125°C | 293 K |
| SNJ54BCT8240AFK | SCAN TEST DEVICES WITH OCTAL BUFFERS | Texas-Instruments | FK | 28 | -55°C | 125°C | 293 K |
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