| Electronic component: | Description: | Manuf. | Package | Pins | T°min | T°max | Datasheet |
|---|
| LM324ADR2 | Quad Low Power Operational Amplifier | ON-Semiconductor | SOIC | 14 | - | - | 172 K |
| MC33074ADR2 | High Slew Rate, Wide Bandwidth, Single Supply Operational Amplifiers | ON-Semiconductor | SOIC | 14 | - | - | 432 K |
| MC33074ADTB | High Slew Rate, Wide Bandwidth, Single Supply Operational Amplifiers | ON-Semiconductor | TSSOP | 14 | - | - | 432 K |
| MC33074ADTBR2 | High Slew Rate, Wide Bandwidth, Single Supply Operational Amplifiers | ON-Semiconductor | TSSOP | 14 | - | - | 432 K |
| MC33274ADR2 | Single Supply, High Slew Rate Low Input Offset Voltage, Bipolar Op Amp | ON-Semiconductor | SOIC | 14 | - | - | 287 K |
| MC34074ADR2 | High Slew Rate, Wide Bandwidth, Single Supply Operational Amplifiers | ON-Semiconductor | SOIC | 14 | - | - | 432 K |
| MC74HC164ADR2 | 8-Bit Serial-Input/Parallel-Output Shift Register | ON-Semiconductor | SOIC | 14 | - | - | 195 K |
| MC74HC164ADT | 8-Bit Serial-Input/Parallel-Output Shift Register | ON-Semiconductor | TSSOP | 14 | - | - | 195 K |
| MC74HC164ADTEL | 8-Bit Serial-Input/Parallel-Output Shift Register | ON-Semiconductor | TSSOP | 14 | - | - | 195 K |
| SN74BCT8374ADWR | SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS | Texas-Instruments | DW | 24 | 0°C | 70°C | 294 K |
| SN74BCT8374ADWR | SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS | Texas-Instruments | DW | 24 | 0°C | 70°C | 294 K |
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