| Electronic component: | Description: | Manuf. | Package | Pins | T°min | T°max | Datasheet |
|---|
| SN74BCT8240ADW | IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL INVERTING BUFFERS | Texas-Instruments | DW | 24 | 0°C | 70°C | 293 K |
| SN74BCT8240ADWR | IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL INVERTING BUFFERS | Texas-Instruments | DW | 24 | 0°C | 70°C | 293 K |
| SN74BCT8240ANT | IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL INVERTING BUFFERS | Texas-Instruments | NT | 24 | 0°C | 70°C | 293 K |
| SN74BCT8244ADW | IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL BUFFERS | Texas-Instruments | DW | 24 | 0°C | 70°C | 293 K |
| SNJ54BCT8244AFK | SCAN TEST DEVICES WITH OCTAL BUFFERS | Texas-Instruments | FK | 28 | -55°C | 125°C | 293 K |
| SNJ54BCT8244AJT | SCAN TEST DEVICES WITH OCTAL BUFFERS | Texas-Instruments | JT | 24 | -55°C | 125°C | 293 K |
| SNJ54BCT8245AFK | SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS | Texas-Instruments | FK | 28 | -55°C | 125°C | 309 K |
| SNJ54BCT8245AJT | SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS | Texas-Instruments | JT | 24 | -55°C | 125°C | 309 K |
| SNJ54BCT8373AFK | SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES | Texas-Instruments | FK | 28 | -55°C | 125°C | 294 K |
| SNJ54BCT8373AJT | SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES | Texas-Instruments | JT | 24 | -55°C | 125°C | 294 K |
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