| Electronic component: | Description: | Manuf. | Package | Pins | T°min | T°max | Datasheet |
|---|
| JM38510/07004BCA | HEX INVERTERS WITH OPEN-COLLECTOR OUTPUTS | Texas-Instruments | J | 14 | -55°C | 125°C | 240 K |
| JM38510/31004BCA | QUADRUPLE 2-INPUT POSITIVE-AND GATES | Texas-Instruments | J | 14 | -55°C | 125°C | 196 K |
| JM38510/65204BCA | TRIPLE 3-INPUT POSITIVE-AND GATES | Texas-Instruments | J | 14 | -55°C | 125°C | 77 K |
| SN74BCT574DBR | OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS | Texas-Instruments | DB | 20 | 0°C | 70°C | 74 K |
| SN74BCT574DBR | OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS | Texas-Instruments | DB | 20 | 0°C | 70°C | 74 K |
| SN74BCT574DW | OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS | Texas-Instruments | DW | 20 | 0°C | 70°C | 74 K |
| SN74BCT574DWR | OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS | Texas-Instruments | DW | 20 | 0°C | 70°C | 74 K |
| SN74BCT574N | OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS | Texas-Instruments | N | 20 | 0°C | 70°C | 74 K |
| SNJ54BCT8374AFK | SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS | Texas-Instruments | FK | 28 | -55°C | 125°C | 294 K |
| SNJ54BCT8374AFK | SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS | Texas-Instruments | FK | 28 | -55°C | 125°C | 294 K |
| SNJ54BCT8374AJT | SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS | Texas-Instruments | JT | 24 | -55°C | 125°C | 294 K |
| [1] [2] [3] 4 [5] [6] [7] [8] [9] [10] |
|---|
