Electronic component: | Description: | Manuf. | Package | Pins | T°min | T°max | Datasheet |
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5962-9172501M3A | SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES | Texas-Instruments | FK | 28 | -55°C | 125°C | 294 K |
5962-9461501Q3A | SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANCEIVERS | Texas-Instruments | FK | 28 | -55°C | 125°C | 357 K |
5962-9461501QXA | SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANCEIVERS | Texas-Instruments | JT | 28 | -55°C | 125°C | 357 K |
5962-9677501QXA | 16-BIT INCIDENT-WAVE SWITCHING BUS TRANSCEIVERS WITH 3-STATE OUTPUTS | Texas-Instruments | WD | 48 | -55°C | 125°C | 128 K |
BB501C | Small signal high frequency amplifier field effect (FET) transistor | distributor | - | - | - | - | 71 K |
BB501M | Small signal high frequency amplifier field effect (FET) transistor | distributor | - | - | - | - | 71 K |
HD14501UB | Triple Gate: Dual 4-input NAND Gates, 2-input NOR/OR Gate | distributor | - | - | - | - | 69 K |
MJ15011 | Complementary Silicon Power Transistors | ON-Semiconductor | - | 2 | - | - | 129 K |
TL5501CDWAR | 6-BIT ADC | Texas-Instruments | DWA | 16 | 0°C | 70°C | 115 K |
TL5501CN | 6-BIT ADC | Texas-Instruments | N | 16 | 0°C | 70°C | 115 K |
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