| Electronic component: | Description: | Manuf. | Package | Pins | T°min | T°max | Datasheet |
|---|
| IDT29FCT52AP | Fast CMOS octal registered transceivers | Integrated-Device-Technology-Inc- | PDIP | - | 0°C | 70°C | 62 K |
| NDS352AP | P-Channel Logic Level Enhancement Mode Field Effect Transistor | Fairchild-Semiconductor | - | 3 | - | - | 78 K |
| NDT452AP | P-Channel Enhancement Mode Field Effect Transistor | Fairchild-Semiconductor | - | 3 | - | - | 92 K |
| SN74ABTH182652APM | SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS | Texas-Instruments | PM | 64 | -40°C | 85°C | 575 K |
| SN74ABTH182652APM | SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS | Texas-Instruments | PM | 64 | -40°C | 85°C | 575 K |
| SN74ABTH18652APM | SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS | Texas-Instruments | PM | 64 | -40°C | 85°C | 575 K |
| SN74LV4052APWR | DUAL 4-CHANNEL ANALOG MULTIPLEXER/DEMULTIPLEXER | Texas-Instruments | PW | 16 | -40°C | 85°C | 170 K |
| SN74LV4052APWR | DUAL 4-CHANNEL ANALOG MULTIPLEXER/DEMULTIPLEXER | Texas-Instruments | PW | 16 | -40°C | 85°C | 170 K |
| SN74LVTH182652APM | 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS | Texas-Instruments | PM | 64 | -40°C | 85°C | 561 K |
| SN74LVTH18652APM | 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS | Texas-Instruments | PM | 64 | -40°C | 85°C | 561 K |
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