| Electronic component: | Description: | Manuf. | Package | Pins | T°min | T°max | Datasheet |
|---|
| JM38510/05554BEA | CMOS HEX NON-INVERTING BUFFER/CONVERTER | Texas-Instruments | J | 16 | -55°C | 125°C | 77 K |
| SNJ54BCT623W | OCTAL BUS TRANSCEIVERS WITH 3-STATE OUTPUTS | Texas-Instruments | W | 20 | -55°C | 125°C | 78 K |
| SNJ54BCT640FK | OCTAL BUS TRANSCEIVERS WITH 3-STATE OUTPUTS | Texas-Instruments | FK | 20 | -55°C | 125°C | 77 K |
| SNJ54BCT640J | OCTAL BUS TRANSCEIVERS WITH 3-STATE OUTPUTS | Texas-Instruments | J | 20 | -55°C | 125°C | 77 K |
| SNJ54BCT640J | OCTAL BUS TRANSCEIVERS WITH 3-STATE OUTPUTS | Texas-Instruments | J | 20 | -55°C | 125°C | 77 K |
| SNJ54BCT640W | OCTAL BUS TRANSCEIVERS WITH 3-STATE OUTPUTS | Texas-Instruments | W | 20 | -55°C | 125°C | 77 K |
| SNJ54BCT8240AFK | SCAN TEST DEVICES WITH OCTAL BUFFERS | Texas-Instruments | FK | 28 | -55°C | 125°C | 293 K |
| SNJ54BCT8240AFK | SCAN TEST DEVICES WITH OCTAL BUFFERS | Texas-Instruments | FK | 28 | -55°C | 125°C | 293 K |
| SNJ54BCT8240AFK | SCAN TEST DEVICES WITH OCTAL BUFFERS | Texas-Instruments | FK | 28 | -55°C | 125°C | 293 K |
| SNJ54BCT8240AFK | SCAN TEST DEVICES WITH OCTAL BUFFERS | Texas-Instruments | FK | 28 | -55°C | 125°C | 293 K |
| TLC254BCD | LINCMOS(TM) QUAD OPERATIONAL AMPLIFIER | Texas-Instruments | D | 14 | - | - | 315 K |
| TLC254BCN | LINCMOS(TM) QUAD OPERATIONAL AMPLIFIER | Texas-Instruments | N | 14 | - | - | 315 K |
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