| Electronic component: | Description: | Manuf. | Package | Pins | T°min | T°max | Datasheet |
|---|
| JM38510/05254BCA | CMOS TRIPLE 3-INPUT NOR GATE | Texas-Instruments | J | 14 | -55°C | 125°C | 206 K |
| JM38510/05754BEA | CMOS 8-STAGE STATIC SHIFT REGISTER | Texas-Instruments | J | 16 | -55°C | 125°C | 236 K |
| SNJ54BCT373FK | OCTAL TRANSPARENT D-TYPE LATCHES WITH 3-STATE OUTPUTS | Texas-Instruments | FK | 20 | -55°C | 125°C | 98 K |
| SNJ54BCT373J | OCTAL TRANSPARENT D-TYPE LATCHES WITH 3-STATE OUTPUTS | Texas-Instruments | J | 20 | -55°C | 125°C | 98 K |
| SNJ54BCT373W | OCTAL TRANSPARENT D-TYPE LATCHES WITH 3-STATE OUTPUTS | Texas-Instruments | W | 20 | -55°C | 125°C | 98 K |
| SNJ54BCT573FK | OCTAL TRANSPARENT D-TYPE LATCHES WITH 3-STATE OUTPUTS | Texas-Instruments | FK | 20 | -55°C | 125°C | 73 K |
| SNJ54BCT573J | OCTAL TRANSPARENT D-TYPE LATCHES WITH 3-STATE OUTPUTS | Texas-Instruments | J | 20 | -55°C | 125°C | 73 K |
| SNJ54BCT573W | OCTAL TRANSPARENT D-TYPE LATCHES WITH 3-STATE OUTPUTS | Texas-Instruments | W | 20 | -55°C | 125°C | 73 K |
| SNJ54BCT8374AFK | SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS | Texas-Instruments | FK | 28 | -55°C | 125°C | 294 K |
| SNJ54BCT8374AFK | SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS | Texas-Instruments | FK | 28 | -55°C | 125°C | 294 K |
| SNJ54BCT8374AJT | SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS | Texas-Instruments | JT | 24 | -55°C | 125°C | 294 K |
| [1] [2] [3] [4] [5] 6 [7] [8] [9] [10] |
|---|
