| Electronic component: | Description: | Manuf. | Package | Pins | T°min | T°max | Datasheet |
|---|
| 5962-8764001WA1 | 4/8-Bit Parallel-Input Latched Drivers | distributor | CERDIP | 22 | - | - | 114 K |
| 5962-9154504MXX | High-speed high-density UV erasable programmable logic device | ATMEL-Corporation | LCC | 44 | -55°C | 125°C | 868 K |
| 5962-9154504MYX | High-speed high-density UV erasable programmable logic device | ATMEL-Corporation | JLCC | 44 | -55°C | 125°C | 868 K |
| 5962-9172501M3A | SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES | Texas-Instruments | FK | 28 | -55°C | 125°C | 294 K |
| 5962-9172601M3A | SCAN TEST DEVICES WITH OCTAL BUFFERS | Texas-Instruments | FK | 28 | -55°C | 125°C | 293 K |
| 5962-9172601M3A | SCAN TEST DEVICES WITH OCTAL BUFFERS | Texas-Instruments | FK | 28 | -55°C | 125°C | 293 K |
| 5962-9172801Q3A | SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS | Texas-Instruments | FK | 28 | -55°C | 125°C | 309 K |
| 5962-9318601MLA | SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS | Texas-Instruments | JT | 24 | -55°C | 125°C | 342 K |
| 5962-9461501Q3A | SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANCEIVERS | Texas-Instruments | FK | 28 | -55°C | 125°C | 357 K |
| 5962-9461501QXA | SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANCEIVERS | Texas-Instruments | JT | 28 | -55°C | 125°C | 357 K |
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