| Electronic component: | Description: | Manuf. | Package | Pins | T°min | T°max | Datasheet |
|---|
| CD74FCT646M96 | BICMOS FCT INTERFACE LOGIC OCTAL NON-INVERTING BUS TRANSCEIVERS WITH 3-STATE OUTPUTS | Texas-Instruments | DW | 24 | 0°C | 70°C | 54 K |
| CD74FCT646M96 | BICMOS FCT INTERFACE LOGIC OCTAL NON-INVERTING BUS TRANSCEIVERS WITH 3-STATE OUTPUTS | Texas-Instruments | DW | 24 | 0°C | 70°C | 54 K |
| CD74FCT646SM | BICMOS FCT INTERFACE LOGIC OCTAL NON-INVERTING BUS TRANSCEIVERS WITH 3-STATE OUTPUTS | Texas-Instruments | DB | 24 | 0°C | 70°C | 54 K |
| CD74FCT646SM | BICMOS FCT INTERFACE LOGIC OCTAL NON-INVERTING BUS TRANSCEIVERS WITH 3-STATE OUTPUTS | Texas-Instruments | DB | 24 | 0°C | 70°C | 54 K |
| SN74ABT18646PM | SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS | Texas-Instruments | PM | 64 | -40°C | 85°C | 145 K |
| SN74ABT18646PM | SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS | Texas-Instruments | PM | 64 | -40°C | 85°C | 145 K |
| SN74ABT18646PM | SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS | Texas-Instruments | PM | 64 | -40°C | 85°C | 145 K |
| SN74ABT8646DL | SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS | Texas-Instruments | DL | 28 | -40°C | 85°C | 388 K |
| SN74ABT8646DLR | SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS | Texas-Instruments | DL | 28 | -40°C | 85°C | 388 K |
| SN74ABT8646DW | SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS | Texas-Instruments | DW | 28 | -40°C | 85°C | 388 K |
| SN74ABT8646DWR | SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS | Texas-Instruments | DW | 28 | -40°C | 85°C | 388 K |
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