| Electronic component: | Description: | Manuf. | Package | Pins | T°min | T°max | Datasheet |
|---|
| MC74AC646DW | Octal Transceiver/Register with 3 State Outputs (Non Inverting) | ON-Semiconductor | SOIC | 24 | - | - | 242 K |
| MC74AC646DWR2 | Octal Transceiver/Register with 3 State Outputs (Non Inverting) | ON-Semiconductor | SOIC | 24 | - | - | 242 K |
| MC74AC646N | Octal Transceiver/Register with 3 State Outputs (Non Inverting) | ON-Semiconductor | PDIP | 24 | - | - | 242 K |
| MC74LCX646DTR2 | Low-Voltage CMOS Octal Transceiver/Registered Transceiver with 5V Tolerant Inputs and Outp | ON-Semiconductor | - | - | - | - | 169 K |
| MC74LCX646DW | Low-Voltage CMOS Octal Transceiver/Registered Transceiver with 5V Tolerant Inputs and Outp | ON-Semiconductor | SOIC | 24 | - | - | 169 K |
| MPS3646RLRA | Switching Transistor | ON-Semiconductor | - | 3 | - | - | 190 K |
| SN74ABTH182646APM | SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS | Texas-Instruments | PM | 64 | -40°C | 85°C | 559 K |
| SN74ABTH18646APM | SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS | Texas-Instruments | PM | 64 | -40°C | 85°C | 559 K |
| SN74LVTH182646APM | 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS | Texas-Instruments | PM | 64 | -40°C | 85°C | 551 K |
| SN74LVTH18646APM | 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS | Texas-Instruments | PM | 64 | -40°C | 85°C | 551 K |
| << [22] [23] [24] [25] [26] 27 [28] [29] [30] [31] [32] >> |
|---|
