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Electronic component:Description:Manuf.PackagePinsT°minT°maxDatasheet
MC74HC273ADTOctal D Flip-Flop with Common Clock and Reset with LSTTL Compatible InputsON-SemiconductorTSSOP20--152 K
MC74HC273ADTR2Octal D Flip-Flop with Common Clock and Reset with LSTTL Compatible InputsON-SemiconductorTSSOP20--152 K
MC74HC273ADWOctal D Flip-Flop with Common Clock and Reset with LSTTL Compatible InputsON-SemiconductorSOIC20--152 K
MC74HC273ADWR2Octal D Flip-Flop with Common Clock and Reset with LSTTL Compatible InputsON-SemiconductorSOIC20--152 K
MC74HC273AFOctal D Flip-Flop with Common Clock and Reset with LSTTL Compatible InputsON-Semiconductor----152 K
MC74HC273AFL1Octal D Flip-Flop with Common Clock and Reset with LSTTL Compatible InputsON-Semiconductor----152 K
MC74HC273AFR1Octal D Flip-Flop with Common Clock and Reset with LSTTL Compatible InputsON-Semiconductor----152 K
MC74HC273AFR2Octal D Flip-Flop with Common Clock and Reset with LSTTL Compatible InputsON-Semiconductor----152 K
MC74HC273ANOctal D Flip-Flop with Common Clock and Reset with LSTTL Compatible InputsON-SemiconductorPDIP20--152 K
SN74BCT8373ANT IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL D-TYPE LATCHESTexas-InstrumentsNT240°C70°C294 K
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