Electronic component: | Description: | Manuf. | Package | Pins | T°min | T°max | Datasheet |
---|
MC74HC273ADT | Octal D Flip-Flop with Common Clock and Reset with LSTTL Compatible Inputs | ON-Semiconductor | TSSOP | 20 | - | - | 152 K |
MC74HC273ADTR2 | Octal D Flip-Flop with Common Clock and Reset with LSTTL Compatible Inputs | ON-Semiconductor | TSSOP | 20 | - | - | 152 K |
MC74HC273ADW | Octal D Flip-Flop with Common Clock and Reset with LSTTL Compatible Inputs | ON-Semiconductor | SOIC | 20 | - | - | 152 K |
MC74HC273ADWR2 | Octal D Flip-Flop with Common Clock and Reset with LSTTL Compatible Inputs | ON-Semiconductor | SOIC | 20 | - | - | 152 K |
MC74HC273AF | Octal D Flip-Flop with Common Clock and Reset with LSTTL Compatible Inputs | ON-Semiconductor | - | - | - | - | 152 K |
MC74HC273AFL1 | Octal D Flip-Flop with Common Clock and Reset with LSTTL Compatible Inputs | ON-Semiconductor | - | - | - | - | 152 K |
MC74HC273AFR1 | Octal D Flip-Flop with Common Clock and Reset with LSTTL Compatible Inputs | ON-Semiconductor | - | - | - | - | 152 K |
MC74HC273AFR2 | Octal D Flip-Flop with Common Clock and Reset with LSTTL Compatible Inputs | ON-Semiconductor | - | - | - | - | 152 K |
MC74HC273AN | Octal D Flip-Flop with Common Clock and Reset with LSTTL Compatible Inputs | ON-Semiconductor | PDIP | 20 | - | - | 152 K |
SN74BCT8373ANT | IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL D-TYPE LATCHES | Texas-Instruments | NT | 24 | 0°C | 70°C | 294 K |
<< [16] [17] [18] [19] [20] 21 [22] [23] [24] [25] [26] >> |
---|