Electronic component: | Description: | Manuf. | Package | Pins | T°min | T°max | Datasheet |
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SN54AS74AJ | DUAL POSITIVE-EDGE-TRIGGERED D-TYPE FLIP-FLOPS WITH CLEAR AND PRESET | Texas-Instruments | J | 14 | -55°C | 125°C | 114 K |
SNJ54ALS74AW | DUAL POSITIVE-EDGE-TRIGGERED D-TYPE FLIP-FLOPS WITH CLEAR AND PRESET | Texas-Instruments | W | 14 | -55°C | 125°C | 114 K |
SNJ54ALS74AW | DUAL POSITIVE-EDGE-TRIGGERED D-TYPE FLIP-FLOPS WITH CLEAR AND PRESET | Texas-Instruments | W | 14 | -55°C | 125°C | 114 K |
SNJ54AS74AFK | DUAL POSITIVE-EDGE-TRIGGERED D-TYPE FLIP-FLOPS WITH CLEAR AND PRESET | Texas-Instruments | FK | 20 | -55°C | 125°C | 114 K |
SNJ54AS74AJ | DUAL POSITIVE-EDGE-TRIGGERED D-TYPE FLIP-FLOPS WITH CLEAR AND PRESET | Texas-Instruments | J | 14 | -55°C | 125°C | 114 K |
SNJ54BCT8374AFK | SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS | Texas-Instruments | FK | 28 | -55°C | 125°C | 294 K |
SNJ54BCT8374AFK | SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS | Texas-Instruments | FK | 28 | -55°C | 125°C | 294 K |
SNJ54BCT8374AJT | SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS | Texas-Instruments | JT | 24 | -55°C | 125°C | 294 K |
SNJ54F74FK | DUAL POSITIVE-EDGE-TRIGGERED D-TYPE FLIP-FLOPS WITH CLEAR AND PRESET | Texas-Instruments | FK | 20 | -55°C | 125°C | 76 K |
SNJ54HC174FK | HEX D-TYPE FLIP-FLOPS WITH CLEAR | Texas-Instruments | FK | 20 | -55°C | 125°C | 92 K |
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