| Electronic component: | Description: | Manuf. | Package | Pins | T°min | T°max | Datasheet |
|---|
| 74ABT125CMTC | Quad Buffer with 3-STATE Outputs | Fairchild-Semiconductor | TSSOP | 14 | - | - | 69 K |
| 74ABT125CMTCX | Quad Buffer with 3-STATE Outputs | Fairchild-Semiconductor | TSSOP | 14 | - | - | 69 K |
| 74ABT125CSC | Quad Buffer with 3-STATE Outputs | Fairchild-Semiconductor | SOIC | 14 | - | - | 69 K |
| 74ABT125CSCX | Quad Buffer with 3-STATE Outputs | Fairchild-Semiconductor | SOIC | 14 | - | - | 69 K |
| 74ABT125CSJ | Quad Buffer with 3-STATE Outputs | Fairchild-Semiconductor | SOIC | 14 | - | - | 69 K |
| 74ABT125CSJX | Quad Buffer with 3-STATE Outputs | Fairchild-Semiconductor | SOIC | 14 | - | - | 69 K |
| SN74ABTH18502APMR | SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS | Texas-Instruments | PM | 64 | -40°C | 85°C | 549 K |
| SN74ABTH18502APMR | SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS | Texas-Instruments | PM | 64 | -40°C | 85°C | 549 K |
| SN74ABTH18504APM | SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS | Texas-Instruments | PM | 64 | -40°C | 85°C | 547 K |
| SN74ABTH18646APM | SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS | Texas-Instruments | PM | 64 | -40°C | 85°C | 559 K |
| SN74ABTH18652APM | SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS | Texas-Instruments | PM | 64 | -40°C | 85°C | 575 K |
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