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Electronic component:Description:Manuf.PackagePinsT°minT°maxDatasheet
SN74BCT8373ANT IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL D-TYPE LATCHESTexas-InstrumentsNT240°C70°C294 K
SN74BCT8374ADW SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPSTexas-InstrumentsDW240°C70°C294 K
SN74BCT8374ADWR SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPSTexas-InstrumentsDW240°C70°C294 K
SN74BCT8374ADWR SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPSTexas-InstrumentsDW240°C70°C294 K
SN74BCT8374ANT SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPSTexas-InstrumentsNT240°C70°C294 K
SN74BCT8374ANT SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPSTexas-InstrumentsNT240°C70°C294 K
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