| Electronic component: | Description: | Manuf. | Package | Pins | T°min | T°max | Datasheet |
|---|
| MC33074AD | High Slew Rate, Wide Bandwidth, Single Supply Operational Amplifiers | ON-Semiconductor | SOIC | 14 | - | - | 432 K |
| MC33074ADR2 | High Slew Rate, Wide Bandwidth, Single Supply Operational Amplifiers | ON-Semiconductor | SOIC | 14 | - | - | 432 K |
| SN74BCT8374ADW | SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS | Texas-Instruments | DW | 24 | 0°C | 70°C | 294 K |
| SN74BCT8374ADWR | SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS | Texas-Instruments | DW | 24 | 0°C | 70°C | 294 K |
| SN74BCT8374ADWR | SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS | Texas-Instruments | DW | 24 | 0°C | 70°C | 294 K |
| SN74LV74ADR | DUAL POSITIVE-EDGE-TRIGGERED D-TYPE FLIP-FLOPS | Texas-Instruments | D | 14 | -40°C | 85°C | 157 K |
| SN74LV74ADR | DUAL POSITIVE-EDGE-TRIGGERED D-TYPE FLIP-FLOPS | Texas-Instruments | D | 14 | -40°C | 85°C | 157 K |
| SN74LVC74AD | DUAL POSITIVE-EDGE-TRIGGERED D-TYPE FLIP-FLOPS WITH CLEAR AND PRESET | Texas-Instruments | D | 14 | -40°C | 85°C | 130 K |
| SN74LVC74ADBLE | DUAL POSITIVE-EDGE-TRIGGERED D-TYPE FLIP-FLOPS WITH CLEAR AND PRESET | Texas-Instruments | DB | 14 | -40°C | 85°C | 130 K |
| SN74LVC74ADBR | DUAL POSITIVE-EDGE-TRIGGERED D-TYPE FLIP-FLOPS WITH CLEAR AND PRESET | Texas-Instruments | DB | 14 | -40°C | 85°C | 130 K |
| SN74LVC74ADR | DUAL POSITIVE-EDGE-TRIGGERED D-TYPE FLIP-FLOPS WITH CLEAR AND PRESET | Texas-Instruments | D | 14 | -40°C | 85°C | 130 K |
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