| Electronic component: | Description: | Manuf. | Package | Pins | T°min | T°max | Datasheet |
|---|
| 74LVT162240MEA | Low Voltage 16-Bit Inverting Buffer/Line Driver with 3-STATE Outputs and 25 Ohm Series Resistors in the Outputs | Fairchild-Semiconductor | SSOP | 48 | - | - | 53 K |
| 74LVT162240MEAX | Low Voltage 16-Bit Inverting Buffer/Line Driver with 3-STATE Outputs and 25 Ohm Series Resistors in the Outputs | Fairchild-Semiconductor | SSOP | 48 | - | - | 53 K |
| 74LVT162240MTD | Low Voltage 16-Bit Inverting Buffer/Line Driver with 3-STATE Outputs and 25 Ohm Series Resistors in the Outputs | Fairchild-Semiconductor | TSSOP | 48 | - | - | 53 K |
| SN74LVTH18502APMR | 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS | Texas-Instruments | PM | 64 | -40°C | 85°C | 478 K |
| SN74LVTH18504APM | 3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS | Texas-Instruments | PM | 64 | -40°C | 85°C | 544 K |
| SN74LVTH18504APMR | 3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS | Texas-Instruments | PM | 64 | -40°C | 85°C | 544 K |
| SN74LVTH18512DGGR | 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS | Texas-Instruments | DGG | 64 | -40°C | 85°C | 518 K |
| SN74LVTH18514DGGR | 3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS | Texas-Instruments | DGG | 64 | -40°C | 85°C | 548 K |
| SN74LVTH18646APM | 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS | Texas-Instruments | PM | 64 | -40°C | 85°C | 551 K |
| SN74LVTH18652APM | 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS | Texas-Instruments | PM | 64 | -40°C | 85°C | 561 K |
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