Electronic component: | Description: | Manuf. | Package | Pins | T°min | T°max | Datasheet |
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AD7545ABE | -0.3 to +17V; 450mW; CMOS 12-bit buffered multiplying DAC | Analog-Devices | LCC | 20 | -25°C | 85°C | 325 K |
AD7545ABE | -0.3 to +17V; 450mW; CMOS 12-bit buffered multiplying DAC | Analog-Devices | LCC | 20 | -25°C | 85°C | 325 K |
AD7545ACE | -0.3 to +17V; 450mW; CMOS 12-bit buffered multiplying DAC | Analog-Devices | LCC | 20 | -25°C | 85°C | 325 K |
AD7545ATE | -0.3 to +17V; 450mW; CMOS 12-bit buffered multiplying DAC | Analog-Devices | LCC | 20 | -25°C | 85°C | 325 K |
AD7545AUE | -0.3 to +17V; 450mW; CMOS 12-bit buffered multiplying DAC | Analog-Devices | LCC | 20 | -25°C | 85°C | 325 K |
AD7547JN | -0.3 to +17V; 450mW; LC2MOS parallel loading dual 12-bit DAC. For automatic test equipment, programmable filters, audio applications | Analog-Devices | DIP | 24 | -40°C | 85°C | 189 K |
AD7547JP | -0.3 to +17V; 450mW; LC2MOS parallel loading dual 12-bit DAC. For automatic test equipment, programmable filters, audio applications | Analog-Devices | PLCC | 28 | -40°C | 85°C | 189 K |
AD7547KN | -0.3 to +17V; 450mW; LC2MOS parallel loading dual 12-bit DAC. For automatic test equipment, programmable filters, audio applications | Analog-Devices | DIP | 24 | -40°C | 85°C | 189 K |
AD7547KP | -0.3 to +17V; 450mW; LC2MOS parallel loading dual 12-bit DAC. For automatic test equipment, programmable filters, audio applications | Analog-Devices | PLCC | 28 | -40°C | 85°C | 189 K |
AD7547LN | -0.3 to +17V; 450mW; LC2MOS parallel loading dual 12-bit DAC. For automatic test equipment, programmable filters, audio applications | Analog-Devices | DIP | 24 | -40°C | 85°C | 189 K |
AD7547LP | -0.3 to +17V; 450mW; LC2MOS parallel loading dual 12-bit DAC. For automatic test equipment, programmable filters, audio applications | Analog-Devices | PLCC | 28 | -40°C | 85°C | 189 K |
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