| Electronic component: | Description: | Manuf. | Package | Pins | T°min | T°max | Datasheet |
|---|
| 82452NX | RAS/CAS generator (RCG) | Intel-Corporation | BGA | 324 | 0°C | 85°C | 2 M |
| PW82451NX | Memory & I/O controller (MIOC) | Intel-Corporation | PBGA | 540 | 0°C | 85°C | 2 M |
| PW82454NX | PCI expander bridge (PXB) | Intel-Corporation | PBGA | 540 | 0°C | 85°C | 2 M |
| SCAN18245TSSC | Non-Inverting Transceiver with 3-STATE Outputs | Fairchild-Semiconductor | SSOP | 56 | - | - | 96 K |
| SCAN18245TSSCX | Non-Inverting Transceiver with 3-STATE Outputs | Fairchild-Semiconductor | SSOP | 56 | - | - | 96 K |
| SN74ABT8245DW | SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS | Texas-Instruments | DW | 24 | -40°C | 85°C | 342 K |
| SN74ABT8245DWR | SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS | Texas-Instruments | DW | 24 | -40°C | 85°C | 342 K |
| SN74BCT8245ADW | IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL BUS TRANSCEIVERS | Texas-Instruments | DW | 24 | 0°C | 70°C | 309 K |
| SN74BCT8245ADWR | IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL BUS TRANSCEIVERS | Texas-Instruments | DW | 24 | 0°C | 70°C | 309 K |
| SN74BCT8245ANT | IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL BUS TRANSCEIVERS | Texas-Instruments | NT | 24 | 0°C | 70°C | 309 K |
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