| Electronic component: | Description: | Manuf. | Package | Pins | T°min | T°max | Datasheet |
|---|
| NTE8374 | Integrated circuit. Seven - segment latch/decoder/driver for common anode LED. | distributor | DIP | 16 | 0°C | 70°C | 30 K |
| NTE8374 | Integrated circuit. Seven - segment latch/decoder/driver for common anode LED. | distributor | DIP | 16 | 0°C | 70°C | 30 K |
| SCAN18374TSSC | D Flip-Flop with 3-STATE Outputs | Fairchild-Semiconductor | SSOP | 56 | - | - | 99 K |
| SCAN18374TSSCX | D Flip-Flop with 3-STATE Outputs | Fairchild-Semiconductor | SSOP | 56 | - | - | 99 K |
| SN74BCT8374ADW | SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS | Texas-Instruments | DW | 24 | 0°C | 70°C | 294 K |
| SN74BCT8374ADWR | SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS | Texas-Instruments | DW | 24 | 0°C | 70°C | 294 K |
| SN74BCT8374ADWR | SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS | Texas-Instruments | DW | 24 | 0°C | 70°C | 294 K |
| SN74BCT8374ANT | SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS | Texas-Instruments | NT | 24 | 0°C | 70°C | 294 K |
| SN74BCT8374ANT | SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS | Texas-Instruments | NT | 24 | 0°C | 70°C | 294 K |
| TDA8374AH | 8 V,I2C-bus controlled economy PAL/NTSC and NTSC TV processor | Philips-Semiconductors | QFP | 64 | 0°C | 70°C | 360 K |
| [1] [2] 3 [4] |
|---|
