| Electronic component: | Description: | Manuf. | Package | Pins | T°min | T°max | Datasheet |
|---|
| BC850BLT1 | General Purpose Transistor NPN | ON-Semiconductor | - | 3 | - | - | 160 K |
| BC850CLT1 | General Purpose Transistor NPN | ON-Semiconductor | - | 3 | - | - | 160 K |
| PFR850S | FAST RECOVERY RECTIFIER DIODES | SGS-Thomson-Microelectronics | - | - | - | - | 30 K |
| SN74ABTH18502APMR | SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS | Texas-Instruments | PM | 64 | -40°C | 85°C | 549 K |
| SN74ABTH18502APMR | SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS | Texas-Instruments | PM | 64 | -40°C | 85°C | 549 K |
| SN74ABTH18504APM | SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS | Texas-Instruments | PM | 64 | -40°C | 85°C | 547 K |
| SN74LVTH18502APM | 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS | Texas-Instruments | PM | 64 | -40°C | 85°C | 478 K |
| SN74LVTH18502APMR | 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS | Texas-Instruments | PM | 64 | -40°C | 85°C | 478 K |
| SN74LVTH18504APM | 3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS | Texas-Instruments | PM | 64 | -40°C | 85°C | 544 K |
| SN74LVTH18504APMR | 3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS | Texas-Instruments | PM | 64 | -40°C | 85°C | 544 K |
| T850-600G | HIGH PERFORMANCE TRIAC | SGS-Thomson-Microelectronics | - | - | - | - | 102 K |
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