| Electronic component: | Description: | Manuf. | Package | Pins | T°min | T°max | Datasheet |
|---|
| JM38510/10901BPA | SINGLE PRECISION TIMER | Texas-Instruments | JG | 8 | -55°C | 125°C | 253 K |
| JM38510/10902BCA | DUAL PRECISION TIMER | Texas-Instruments | J | 14 | -55°C | 125°C | 71 K |
| MC74HC4851AD | Analog Multiplexer/Demultiplexer with Injection Current Effect Control | ON-Semiconductor | SOIC | 16 | - | - | 294 K |
| MC74HC4851ADR2 | Analog Multiplexer/Demultiplexer with Injection Current Effect Control | ON-Semiconductor | SOIC | 16 | - | - | 294 K |
| MC74HC4851ADW | Analog Multiplexer/Demultiplexer with Injection Current Effect Control | ON-Semiconductor | SOIC | 16 | - | - | 294 K |
| MC74HC4851ADWR2 | Analog Multiplexer/Demultiplexer with Injection Current Effect Control | ON-Semiconductor | SOIC | 16 | - | - | 294 K |
| SN74LVT18512DGGR | 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS | Texas-Instruments | DGG | 64 | -40°C | 85°C | 544 K |
| SN74LVT18512DGGR | 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS | Texas-Instruments | DGG | 64 | -40°C | 85°C | 544 K |
| SN74LVTH18512DGGR | 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS | Texas-Instruments | DGG | 64 | -40°C | 85°C | 518 K |
| SN74LVTH18514DGGR | 3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS | Texas-Instruments | DGG | 64 | -40°C | 85°C | 548 K |
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