Electronic component: | Description: | Manuf. | Package | Pins | T°min | T°max | Datasheet |
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SN74ABT16470DGGR | 16-BIT REGISTERED TRANSCEIVERS WITH 3-STATE OUTPUTS | Texas-Instruments | DGG | 56 | -40°C | 85°C | 149 K |
SN74ABT16470DGGR | 16-BIT REGISTERED TRANSCEIVERS WITH 3-STATE OUTPUTS | Texas-Instruments | DGG | 56 | -40°C | 85°C | 149 K |
SN74ABT16470DGGR | 16-BIT REGISTERED TRANSCEIVERS WITH 3-STATE OUTPUTS | Texas-Instruments | DGG | 56 | -40°C | 85°C | 149 K |
SN74ABT16470DL | 16-BIT REGISTERED TRANSCEIVERS WITH 3-STATE OUTPUTS | Texas-Instruments | DL | 56 | -40°C | 85°C | 149 K |
SN74ABT16470DL | 16-BIT REGISTERED TRANSCEIVERS WITH 3-STATE OUTPUTS | Texas-Instruments | DL | 56 | -40°C | 85°C | 149 K |
SN74ABT16470DLR | 16-BIT REGISTERED TRANSCEIVERS WITH 3-STATE OUTPUTS | Texas-Instruments | DL | 56 | -40°C | 85°C | 149 K |
SNJ54ABT8646JT | SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS | Texas-Instruments | JT | 28 | -55°C | 125°C | 388 K |
SNJ54ABT8652FK | SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS | Texas-Instruments | FK | 28 | -55°C | 125°C | 366 K |
SNJ54ABT8652JT | SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS | Texas-Instruments | JT | 28 | -55°C | 125°C | 366 K |
SNJ54ABTH18646AHV | SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS | Texas-Instruments | HV | 68 | -55°C | 125°C | 559 K |
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