| Electronic component: | Description: | Manuf. | Package | Pins | T°min | T°max | Datasheet |
|---|
| AD5201BRM10-REEL7 | 7V; 256-position and 33-position digital potentiometer. For mechanical potentiometer replacement, instrumentation: gain, offset adjustment | Analog-Devices | SOIC | 10 | -40°C | 85°C | 759 K |
| AD5201BRM50-REEL7 | 7V; 256-position and 33-position digital potentiometer. For mechanical potentiometer replacement, instrumentation: gain, offset adjustment | Analog-Devices | SOIC | 10 | -40°C | 85°C | 759 K |
| AD5207BRU10-REEL7 | 0.3-7V; 2-channel, 256-position digital potentiometer | Analog-Devices | TSSOP | 14 | -40°C | 125°C | 664 K |
| AD5207BRU100-REEL7 | 0.3-7V; 2-channel, 256-position digital potentiometer | Analog-Devices | TSSOP | 14 | -40°C | 125°C | 664 K |
| AD5207BRU50-REEL7 | 0.3-7V; 2-channel, 256-position digital potentiometer | Analog-Devices | TSSOP | 14 | -40°C | 125°C | 664 K |
| AD5235BRU25 | 0.3-7V; nonvolatile memory, dual 1024 position digital potentiometer | Analog-Devices | TSSOP | 16 | -40°C | 85°C | 102 K |
| AD5235BRU250 | 0.3-7V; nonvolatile memory, dual 1024 position digital potentiometer | Analog-Devices | TSSOP | 16 | -40°C | 85°C | 102 K |
| AD53509JSQ | 13V; high-performance driver/comparator active load on a single chip. For automatic test equipment, semiconductor test systems, board test equipment | Analog-Devices | LQFP | 52 | -40°C | 85°C | 110 K |
| AD5551BR | 0.3-6V; serial-input voltage-output, 14-bit DAC. For digital gain and offset adjustment, automatic test equipment, data acquisition systems and industrial process control | Analog-Devices | SOIC | 8 | -40°C | 85°C | 220 K |
| AD5552BR | 0.3-6V; serial-input voltage-output, 14-bit DAC. For digital gain and offset adjustment, automatic test equipment, data acquisition systems and industrial process control | Analog-Devices | SOIC | 14 | -40°C | 85°C | 220 K |
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