| Electronic component: | Description: | Manuf. | Package | Pins | T°min | T°max | Datasheet |
|---|
| MC74HC4051ADWR2 | Analog Multiplexers / Demultiplexers | ON-Semiconductor | SOIC | 16 | - | - | 400 K |
| MC74HC4053ADWR2 | Analog Multiplexers / Demultiplexers | ON-Semiconductor | SOIC | 16 | - | - | 400 K |
| SN74BCT8240ADWR | IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL INVERTING BUFFERS | Texas-Instruments | DW | 24 | 0°C | 70°C | 293 K |
| SN74BCT8244ADWR | IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL BUFFERS | Texas-Instruments | DW | 24 | 0°C | 70°C | 293 K |
| SN74BCT8245ADWR | IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL BUS TRANSCEIVERS | Texas-Instruments | DW | 24 | 0°C | 70°C | 309 K |
| SN74BCT8373ADWR | IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL D-TYPE LATCHES | Texas-Instruments | DW | 24 | 0°C | 70°C | 294 K |
| SN74BCT8374ADWR | SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS | Texas-Instruments | DW | 24 | 0°C | 70°C | 294 K |
| SN74BCT8374ADWR | SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS | Texas-Instruments | DW | 24 | 0°C | 70°C | 294 K |
| SN74CBTLV3245ADWR | LOW-VOLTAGE OCTAL FET BUS SWITCH | Texas-Instruments | DW | 20 | -40°C | 85°C | 93 K |
| SN74CBTLV3245ADWR | LOW-VOLTAGE OCTAL FET BUS SWITCH | Texas-Instruments | DW | 20 | -40°C | 85°C | 93 K |
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