| Electronic component: | Description: | Manuf. | Package | Pins | T°min | T°max | Datasheet |
|---|
| 74ABT125CSC | Quad Buffer with 3-STATE Outputs | Fairchild-Semiconductor | SOIC | 14 | - | - | 69 K |
| 74ABT125CSCX | Quad Buffer with 3-STATE Outputs | Fairchild-Semiconductor | SOIC | 14 | - | - | 69 K |
| 74ABT125CSJ | Quad Buffer with 3-STATE Outputs | Fairchild-Semiconductor | SOIC | 14 | - | - | 69 K |
| 74ABT125CSJX | Quad Buffer with 3-STATE Outputs | Fairchild-Semiconductor | SOIC | 14 | - | - | 69 K |
| MMBT1010LT1 | Low Saturation Voltage PNP Silicon Driver Transistors | ON-Semiconductor | - | 3 | - | - | 84 K |
| SN74ABT18646PM | SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS | Texas-Instruments | PM | 64 | -40°C | 85°C | 145 K |
| SN74ABT18646PM | SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS | Texas-Instruments | PM | 64 | -40°C | 85°C | 145 K |
| SN74ABT18646PM | SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS | Texas-Instruments | PM | 64 | -40°C | 85°C | 145 K |
| SN74ABT18652PM | SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS | Texas-Instruments | PM | 64 | -40°C | 85°C | 169 K |
| SN74ABT18652PM | SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS | Texas-Instruments | PM | 64 | -40°C | 85°C | 169 K |
| THBT15011D | TRIPOLAR OVERVOLTAGE PROTECTION FOR TELECOM LINE - (ASD) | SGS-Thomson-Microelectronics | - | - | - | - | 64 K |
| THBT16011D | TRIPOLAR OVERVOLTAGE PROTECTION FOR TELECOM LINE - (ASD) | SGS-Thomson-Microelectronics | - | - | - | - | 64 K |
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