| Electronic component: | Description: | Manuf. | Package | Pins | T°min | T°max | Datasheet |
|---|
| 2SC4663 | High-speed switching bipolar NPN transistor | Shindengen-Electric-Manufacturing-Company-Ltd- | - | - | - | - | 409 K |
| 2SC4664 | High-speed switching bipolar NPN transistor | Shindengen-Electric-Manufacturing-Company-Ltd- | - | - | - | - | 418 K |
| 2SC4668 | Low-saturation high-speed voltage switching bipolar transistor | Shindengen-Electric-Manufacturing-Company-Ltd- | - | - | - | - | 413 K |
| 2SC4669 | Low-saturation high-speed voltage switching bipolar transistor | Shindengen-Electric-Manufacturing-Company-Ltd- | - | - | - | - | 404 K |
| IDT49C465AG | 32-bit flow-thru error detection and correction unit | Integrated-Device-Technology-Inc- | Pin grid array | 144 | 0°C | 70°C | 402 K |
| IDT49C465AGB | 32-bit flow-thru error detection and correction unit | Integrated-Device-Technology-Inc- | Pin grid array | 144 | -55°C | 125°C | 402 K |
| IDT49C465APQFB | 32-bit flow-thru error detection and correction unit | Integrated-Device-Technology-Inc- | Pin grid array | 144 | -55°C | 125°C | 402 K |
| IDT49C465G | 32-bit flow-thru error detection and correction unit | Integrated-Device-Technology-Inc- | Pin grid array | 144 | 0°C | 70°C | 402 K |
| IDT49C465GB | 32-bit flow-thru error detection and correction unit | Integrated-Device-Technology-Inc- | Pin grid array | 144 | -55°C | 125°C | 402 K |
| KTC4666 | NPN transistor for low noise amplifier applications | Korea-Electronics-Co--Ltd- | USM | 3 | -55°C | 150°C | 323 K |
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