Electronic component: | Description: | Manuf. | Package | Pins | T°min | T°max | Datasheet |
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CD4010BMS | Radiation Hardened CMOS Hex Buffer/Converter | Intersil-Corporation | - | - | - | - | 78 K |
CD4011BMS | Radiation Hardened CMOS NAND Gates | Intersil-Corporation | - | - | - | - | 109 K |
CD4012BMS | Radiation Hardened CMOS NAND Gates | Intersil-Corporation | - | - | - | - | 109 K |
CD4013BMS | Radiation Hardened CMOS Dual `D-Type Flip-Flop | Intersil-Corporation | - | - | - | - | 74 K |
CD4014BMS | Radiation Hardened CMOS 8-Stage Static Shift Registers | Intersil-Corporation | - | - | - | - | 93 K |
CD4015BMSFN3295 | Radiation Hardened CMOS Dual 4-Stage Static Shift Register With Serial Input/Parallel Output | Intersil-Corporation | - | - | - | - | 118 K |
CD4016BF3A | CMOS QUAD BILATERAL SWITCH | Texas-Instruments | J | 14 | -55°C | 125°C | 262 K |
CD4016BM | CMOS QUAD BILATERAL SWITCH | Texas-Instruments | D | 14 | -55°C | 125°C | 262 K |
CD4016BMS | Radiation Hardened CMOS Quad Bilateral Switch | Intersil-Corporation | - | - | - | - | 201 K |
CD4016BPWR | CMOS QUAD BILATERAL SWITCH | Texas-Instruments | PW | 14 | -55°C | 125°C | 262 K |
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