Electronic component: | Description: | Manuf. | Package | Pins | T°min | T°max | Datasheet |
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CD74FCT841AEN | BICMOS FCT INTERFACE LOGIC 10-BIT NON-INVERTING TRANSPARENT LATCHES WITH 3-STATE OUTPUTS | Texas-Instruments | NT | 24 | 0°C | 70°C | 18 K |
SN74ACT8990FN | TEST-BUS CONTROLLERS IEEE STD 1149.1 (JTAG) TAP MASTERS WITH 16-BIT GENERIC HOST INTERFACES | Texas-Instruments | FN | 44 | 0°C | 70°C | 184 K |
SN74ACT8990FN | TEST-BUS CONTROLLERS IEEE STD 1149.1 (JTAG) TAP MASTERS WITH 16-BIT GENERIC HOST INTERFACES | Texas-Instruments | FN | 44 | 0°C | 70°C | 184 K |
SN74ACT8990FN | TEST-BUS CONTROLLERS IEEE STD 1149.1 (JTAG) TAP MASTERS WITH 16-BIT GENERIC HOST INTERFACES | Texas-Instruments | FN | 44 | 0°C | 70°C | 184 K |
SN74ACT8990FNR | TEST-BUS CONTROLLERS IEEE STD 1149.1 (JTAG) TAP MASTERS WITH 16-BIT GENERIC HOST INTERFACES | Texas-Instruments | FN | 44 | -40°C | 85°C | 184 K |
SN74ACT8994FN | DIGITAL BUS MONITOR IEEE STD 1149.1 (JTAG) SCAN-CONTROLLED LOGIC/SIGNATURE ANALYZERS | Texas-Instruments | FN | 28 | 0°C | 70°C | 157 K |
SN74ACT8994FN | DIGITAL BUS MONITOR IEEE STD 1149.1 (JTAG) SCAN-CONTROLLED LOGIC/SIGNATURE ANALYZERS | Texas-Instruments | FN | 28 | 0°C | 70°C | 157 K |
SN74ACT8994FN | DIGITAL BUS MONITOR IEEE STD 1149.1 (JTAG) SCAN-CONTROLLED LOGIC/SIGNATURE ANALYZERS | Texas-Instruments | FN | 28 | 0°C | 70°C | 157 K |
SN74ACT8997DW | SCAN PATH LINKERS WITH 4-BIT IDENTIFICATION BUSES SCAN-CONTROLLED TAP CONCATENATORS | Texas-Instruments | DW | 28 | 0°C | 70°C | 335 K |
SN74ACT8997DW | SCAN PATH LINKERS WITH 4-BIT IDENTIFICATION BUSES SCAN-CONTROLLED TAP CONCATENATORS | Texas-Instruments | DW | 28 | 0°C | 70°C | 335 K |
SN74ACT8997DWR | SCAN PATH LINKERS WITH 4-BIT IDENTIFICATION BUSES SCAN-CONTROLLED TAP CONCATENATORS | Texas-Instruments | DW | 28 | 0°C | 70°C | 335 K |
SN74ACT8997NT | SCAN PATH LINKERS WITH 4-BIT IDENTIFICATION BUSES SCAN-CONTROLLED TAP CONCATENATORS | Texas-Instruments | NT | 28 | 0°C | 70°C | 335 K |
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