| Electronic component: | Description: | Manuf. | Package | Pins | T°min | T°max | Datasheet |
|---|
| HD74ACT86 | Quad. 2-input Exclusive-OR Gates | distributor | - | - | - | - | 43 K |
| MC74ACT86M | Quad 2 Input Exclusive OR Gate | ON-Semiconductor | - | 14 | - | - | 131 K |
| MC74ACT86MEL | Quad 2 Input Exclusive OR Gate | ON-Semiconductor | - | 14 | - | - | 131 K |
| MC74ACT86ML2 | Quad 2 Input Exclusive OR Gate | ON-Semiconductor | - | 14 | - | - | 131 K |
| MC74ACT86MR1 | Quad 2 Input Exclusive OR Gate | ON-Semiconductor | - | 14 | - | - | 131 K |
| SN74BCT8374ADW | SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS | Texas-Instruments | DW | 24 | 0°C | 70°C | 294 K |
| SN74BCT8374ADWR | SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS | Texas-Instruments | DW | 24 | 0°C | 70°C | 294 K |
| SN74BCT8374ADWR | SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS | Texas-Instruments | DW | 24 | 0°C | 70°C | 294 K |
| SN74BCT8374ANT | SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS | Texas-Instruments | NT | 24 | 0°C | 70°C | 294 K |
| SN74BCT8374ANT | SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS | Texas-Instruments | NT | 24 | 0°C | 70°C | 294 K |
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