| Electronic component: | Description: | Manuf. | Package | Pins | T°min | T°max | Datasheet |
|---|
| CD54ACT86F3A | QUAD 2-INPUT EXCLUSIVE-OR GATES | Texas-Instruments | J | 14 | -55°C | 125°C | 34 K |
| CD54HCT86F | HIGH SPEED CMOS LOGIC QUAD 2-INPUT EXCLUSIVE OR GATES | Texas-Instruments | J | 14 | -55°C | 125°C | 45 K |
| CD54HCT86F3A | HIGH SPEED CMOS LOGIC QUAD 2-INPUT EXCLUSIVE OR GATES | Texas-Instruments | J | 14 | -55°C | 125°C | 45 K |
| CY74FCT823CTSOC | 9-BIT BUS INTERFACE FLIP-FLOPS WITH 3-STATE OUTPUTS | Texas-Instruments | DW | 24 | -40°C | 85°C | 86 K |
| CY74FCT823CTSOCT | 9-BIT BUS INTERFACE FLIP-FLOPS WITH 3-STATE OUTPUTS | Texas-Instruments | DW | 24 | -40°C | 85°C | 86 K |
| CY74FCT825CTQC | 8-BIT BUS INTERFACE FLIP-FLOPS WITH 3-STATE OUTPUTS | Texas-Instruments | DBQ | 24 | -40°C | 85°C | 86 K |
| CY74FCT825CTQCT | 8-BIT BUS INTERFACE FLIP-FLOPS WITH 3-STATE OUTPUTS | Texas-Instruments | DBQ | 24 | -40°C | 85°C | 86 K |
| SNJ54BCT8374AFK | SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS | Texas-Instruments | FK | 28 | -55°C | 125°C | 294 K |
| SNJ54BCT8374AFK | SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS | Texas-Instruments | FK | 28 | -55°C | 125°C | 294 K |
| SNJ54BCT8374AJT | SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS | Texas-Instruments | JT | 24 | -55°C | 125°C | 294 K |
| [1] [2] [3] [4] [5] 6 [7] [8] [9] [10] |
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