| Electronic component: | Description: | Manuf. | Package | Pins | T°min | T°max | Datasheet |
|---|
| 74ACT818CW | 8-Bit Diagnostic Register | Fairchild-Semiconductor | - | - | - | - | 55 K |
| 74ACT818SPC | 8-Bit Diagnostic Register | Fairchild-Semiconductor | MDIP | 24 | - | - | 55 K |
| CY29FCT818ATDMB | DIAGNOSTIC SCAN REGISTER | Texas-Instruments | JT | 24 | -55°C | 125°C | 93 K |
| CY29FCT818CTPC | DIAGNOSTIC SCAN REGISTER | Texas-Instruments | NT | 24 | -40°C | 85°C | 93 K |
| CY29FCT818CTQC | DIAGNOSTIC SCAN REGISTER | Texas-Instruments | DBQ | 24 | -40°C | 85°C | 93 K |
| CY29FCT818CTQCT | DIAGNOSTIC SCAN REGISTER | Texas-Instruments | DBQ | 24 | -40°C | 85°C | 93 K |
| CY29FCT818CTSOC | DIAGNOSTIC SCAN REGISTER | Texas-Instruments | DW | 24 | -40°C | 85°C | 93 K |
| CY29FCT818CTSOCT | DIAGNOSTIC SCAN REGISTER | Texas-Instruments | DW | 24 | -40°C | 85°C | 93 K |
| IDT74FCT810CTQ | Fast CMOS buffer/clock driver | Integrated-Device-Technology-Inc- | SOIC | 20 | 0°C | 70°C | 107 K |
| IDT74FCT810CTQB | Fast CMOS buffer/clock driver | Integrated-Device-Technology-Inc- | SOIC | 20 | 0°C | 70°C | 107 K |
| 1 [2] [3] [4] [5] [6] [7] |
|---|
