| Electronic component: | Description: | Manuf. | Package | Pins | T°min | T°max | Datasheet |
|---|
| AD5300BRM | 2.7-5.5V; rail-to-rail output 8-bit DAC | Analog-Devices | - | 8 | -40°C | 105°C | 198 K |
| AD5300BRT | 2.7-5.5V; rail-to-rail output 8-bit DAC | Analog-Devices | - | 6 | -40°C | 105°C | 198 K |
| AD53041KRP | 12V; ultrahigh speed pin driver with inhibit mode | Analog-Devices | SOIC | 20 | -40°C | 85°C | 89 K |
| AD53041KRP | 12V; ultrahigh speed pin driver with inhibit mode | Analog-Devices | SOIC | 20 | -40°C | 85°C | 89 K |
| AD5310BRM | 2.7-5.5V; rail-to-rail voltage output 10-bit DAC | Analog-Devices | SOIC | 8 | -40°C | 105°C | 176 K |
| AD5310BRT | 2.7-5.5V; rail-to-rail voltage output 10-bit DAC | Analog-Devices | - | 6 | -40°C | 105°C | 176 K |
| AD5310BRT | 2.7-5.5V; rail-to-rail voltage output 10-bit DAC | Analog-Devices | - | 6 | -40°C | 105°C | 176 K |
| AD53509JSQ | 13V; high-performance driver/comparator active load on a single chip. For automatic test equipment, semiconductor test systems, board test equipment | Analog-Devices | LQFP | 52 | -40°C | 85°C | 110 K |
| AD53513JSQ | 11V; quad ultrahigh-speed Pin driver with high-Z and V -term mode. For automatic test equipment, semiconductor test systems, board test systems, intrumentation | Analog-Devices | LQFP | 100 | - | - | 92 K |
| BD533 | NPN Epitaxial Silicon Transistor | Fairchild-Semiconductor | - | - | - | - | 38 K |
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