Electronic component: | Description: | Manuf. | Package | Pins | T°min | T°max | Datasheet |
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DS2016 | 2K x 8 3V/5V Operation Static RAM | Dallas-Semiconductor | DIP | 24 | -40°C | 85°C | 254 K |
DS2016S | 2K x 8 3V/5V Operation Static RAM | Dallas-Semiconductor | SOIC | 24 | -40°C | 85°C | 254 K |
DS2064-200 | 8K x 8 Static RAM | Dallas-Semiconductor | DIP | 28 | -40°C | 85°C | 73 K |
DS2064S-200 | 8K x 8 Static RAM | Dallas-Semiconductor | SOIC | 28 | -40°C | 85°C | 73 K |
DS21372T | 3.3V Bit Error Rate Tester (BERT) | Dallas-Semiconductor | TQFP | 32 | 0°C | 70°C | 214 K |
DS21372TN | 3.3V Bit Error Rate Tester (BERT) | Dallas-Semiconductor | TQFP | 32 | -40°C | 85°C | 214 K |
FDS2570 | 150V N-Channel PowerTrench® MOSFET | Fairchild-Semiconductor | SOIC | 8 | - | - | 232 K |
FDS2670 | 200V N-Channel PowerTrench® MOSFET | Fairchild-Semiconductor | SOIC | 8 | - | - | 339 K |
SN65LVDS2DBVT | HIGH-SPEED DIFFERENTIAL LINE RECEIVER | Texas-Instruments | DBV | 5 | -40°C | 85°C | 131 K |
SN65LVDS2DBVT | HIGH-SPEED DIFFERENTIAL LINE RECEIVER | Texas-Instruments | DBV | 5 | -40°C | 85°C | 131 K |
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