Electronic component: | Description: | Manuf. | Package | Pins | T°min | T°max | Datasheet |
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SNJ54ABT8543JT | SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANCEIVERS | Texas-Instruments | JT | 28 | -55°C | 125°C | 357 K |
SNJ54ABT8543JT | SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANCEIVERS | Texas-Instruments | JT | 28 | -55°C | 125°C | 357 K |
SNJ54ABTH18502AHV | SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS | Texas-Instruments | HV | 68 | -55°C | 125°C | 549 K |
SNJ54BCT8240AFK | SCAN TEST DEVICES WITH OCTAL BUFFERS | Texas-Instruments | FK | 28 | -55°C | 125°C | 293 K |
SNJ54BCT8240AFK | SCAN TEST DEVICES WITH OCTAL BUFFERS | Texas-Instruments | FK | 28 | -55°C | 125°C | 293 K |
SNJ54BCT8240AFK | SCAN TEST DEVICES WITH OCTAL BUFFERS | Texas-Instruments | FK | 28 | -55°C | 125°C | 293 K |
SNJ54BCT8240AFK | SCAN TEST DEVICES WITH OCTAL BUFFERS | Texas-Instruments | FK | 28 | -55°C | 125°C | 293 K |
SNJ54BCT8240AJT | SCAN TEST DEVICES WITH OCTAL BUFFERS | Texas-Instruments | JT | 24 | -55°C | 125°C | 293 K |
SNJ54BCT8244AFK | SCAN TEST DEVICES WITH OCTAL BUFFERS | Texas-Instruments | FK | 28 | -55°C | 125°C | 293 K |
SNJ54BCT8244AJT | SCAN TEST DEVICES WITH OCTAL BUFFERS | Texas-Instruments | JT | 24 | -55°C | 125°C | 293 K |
SNJ54BCT8245AFK | SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS | Texas-Instruments | FK | 28 | -55°C | 125°C | 309 K |
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