| Electronic component: | Description: | Manuf. | Package | Pins | T°min | T°max | Datasheet |
|---|
| 74LVTH125M | Low Voltage Quad Buffer with 3-STATE Outputs | Fairchild-Semiconductor | SOIC | 14 | - | - | 56 K |
| 74LVTH125MTCX | Low Voltage Quad Buffer with 3-STATE Outputs | Fairchild-Semiconductor | TSSOP | 14 | - | - | 56 K |
| 74LVTH125MX | Low Voltage Quad Buffer with 3-STATE Outputs | Fairchild-Semiconductor | SOIC | 14 | - | - | 56 K |
| 74LVTH125SJ | Low Voltage Quad Buffer with 3-STATE Outputs | Fairchild-Semiconductor | SOIC | 14 | - | - | 56 K |
| 74LVTH125SJX | Low Voltage Quad Buffer with 3-STATE Outputs | Fairchild-Semiconductor | SOIC | 14 | - | - | 56 K |
| 74LVTH125SJX | Low Voltage Quad Buffer with 3-STATE Outputs | Fairchild-Semiconductor | SOIC | 14 | - | - | 56 K |
| SN74LVTH18512DGGR | 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS | Texas-Instruments | DGG | 64 | -40°C | 85°C | 518 K |
| SN74LVTH18514DGGR | 3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS | Texas-Instruments | DGG | 64 | -40°C | 85°C | 548 K |
| SN74LVTH18646APM | 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS | Texas-Instruments | PM | 64 | -40°C | 85°C | 551 K |
| SN74LVTH18652APM | 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS | Texas-Instruments | PM | 64 | -40°C | 85°C | 561 K |
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