Electronic component: | Description: | Manuf. | Package | Pins | T°min | T°max | Datasheet |
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SN74ACT8994FN | DIGITAL BUS MONITOR IEEE STD 1149.1 (JTAG) SCAN-CONTROLLED LOGIC/SIGNATURE ANALYZERS | Texas-Instruments | FN | 28 | 0°C | 70°C | 157 K |
SN74ACT8994FN | DIGITAL BUS MONITOR IEEE STD 1149.1 (JTAG) SCAN-CONTROLLED LOGIC/SIGNATURE ANALYZERS | Texas-Instruments | FN | 28 | 0°C | 70°C | 157 K |
SN74ACT8994FN | DIGITAL BUS MONITOR IEEE STD 1149.1 (JTAG) SCAN-CONTROLLED LOGIC/SIGNATURE ANALYZERS | Texas-Instruments | FN | 28 | 0°C | 70°C | 157 K |
SN74ACT8997DW | SCAN PATH LINKERS WITH 4-BIT IDENTIFICATION BUSES SCAN-CONTROLLED TAP CONCATENATORS | Texas-Instruments | DW | 28 | 0°C | 70°C | 335 K |
SN74ACT8997DW | SCAN PATH LINKERS WITH 4-BIT IDENTIFICATION BUSES SCAN-CONTROLLED TAP CONCATENATORS | Texas-Instruments | DW | 28 | 0°C | 70°C | 335 K |
SN74ACT8997DWR | SCAN PATH LINKERS WITH 4-BIT IDENTIFICATION BUSES SCAN-CONTROLLED TAP CONCATENATORS | Texas-Instruments | DW | 28 | 0°C | 70°C | 335 K |
SN74ACT8997NT | SCAN PATH LINKERS WITH 4-BIT IDENTIFICATION BUSES SCAN-CONTROLLED TAP CONCATENATORS | Texas-Instruments | NT | 28 | 0°C | 70°C | 335 K |
SN74LVT8980DW | EMBEDDED TEST-BUS CONTROLLERS IEEE STD 1149.1 (JTAG) TAP MASTERS WITH 8-BIT GENERIC HOST INTERFACES | Texas-Instruments | DW | 24 | -40°C | 85°C | 495 K |
SN74LVT8980DWR | EMBEDDED TEST-BUS CONTROLLERS IEEE STD 1149.1 (JTAG) TAP MASTERS WITH 8-BIT GENERIC HOST INTERFACES | Texas-Instruments | DW | 24 | -40°C | 85°C | 495 K |
SN74LVT8996DW | 3.3-V ABT 10-BIT ADDRESSABLE SCAN PORTS MULTIDROP-ADDRESSABLE IEEE STD 1149.1 (JTAG) TAP TRANSCEIVER | Texas-Instruments | DW | 24 | 0°C | 70°C | 603 K |
SN74LVT8996DWR | 3.3-V ABT 10-BIT ADDRESSABLE SCAN PORTS MULTIDROP-ADDRESSABLE IEEE STD 1149.1 (JTAG) TAP TRANSCEIVER | Texas-Instruments | DW | 24 | 0°C | 70°C | 603 K |
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