| Electronic component: | Description: | Manuf. | Package | Pins | T°min | T°max | Datasheet |
|---|
| SN74ABTH18646APM | SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS | Texas-Instruments | PM | 64 | -40°C | 85°C | 559 K |
| SN74ABTH18652APM | SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS | Texas-Instruments | PM | 64 | -40°C | 85°C | 575 K |
| SN74BCT8240ADW | IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL INVERTING BUFFERS | Texas-Instruments | DW | 24 | 0°C | 70°C | 293 K |
| SN74BCT8240ADWR | IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL INVERTING BUFFERS | Texas-Instruments | DW | 24 | 0°C | 70°C | 293 K |
| SN74BCT8240ANT | IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL INVERTING BUFFERS | Texas-Instruments | NT | 24 | 0°C | 70°C | 293 K |
| SN74BCT8244ADW | IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL BUFFERS | Texas-Instruments | DW | 24 | 0°C | 70°C | 293 K |
| SN74BCT8244ADWR | IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL BUFFERS | Texas-Instruments | DW | 24 | 0°C | 70°C | 293 K |
| SN74BCT8244ANT | IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL BUFFERS | Texas-Instruments | NT | 24 | 0°C | 70°C | 293 K |
| SN74BCT8245ADW | IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL BUS TRANSCEIVERS | Texas-Instruments | DW | 24 | 0°C | 70°C | 309 K |
| SN74BCT8245ADWR | IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL BUS TRANSCEIVERS | Texas-Instruments | DW | 24 | 0°C | 70°C | 309 K |
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