| Electronic component: | Description: | Manuf. | Package | Pins | T°min | T°max | Datasheet |
|---|
| SN74ABT18245ADGGR | SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS | Texas-Instruments | DGG | 56 | -40°C | 85°C | 357 K |
| SN74ABT18245ADL | SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS | Texas-Instruments | DL | 56 | -40°C | 85°C | 357 K |
| SN74ABT18245ADLR | SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS | Texas-Instruments | DL | 56 | -40°C | 85°C | 357 K |
| SN74ABT18502PM | SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVER | Texas-Instruments | PM | 64 | -40°C | 85°C | 451 K |
| SN74ABT18504PM | SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS | Texas-Instruments | PM | 64 | -40°C | 85°C | 450 K |
| SN74ABT18640DGGR | SCAN TEST DEVICES WITH 18-BIT INVERTING BUS TRANSCEIVERS | Texas-Instruments | DGG | 56 | -40°C | 85°C | 400 K |
| SN74ABT18640DL | SCAN TEST DEVICES WITH 18-BIT INVERTING BUS TRANSCEIVERS | Texas-Instruments | DL | 56 | -40°C | 85°C | 400 K |
| SN74ABT18640DLR | SCAN TEST DEVICES WITH 18-BIT INVERTING BUS TRANSCEIVERS | Texas-Instruments | DL | 56 | -40°C | 85°C | 400 K |
| SN74ABT18640DLR | SCAN TEST DEVICES WITH 18-BIT INVERTING BUS TRANSCEIVERS | Texas-Instruments | DL | 56 | -40°C | 85°C | 400 K |
| SN74ABTE16246DL | 11-BIT INCIDENT-WAVE SWITCHING BUS TRANSCEIVERS WITH 3-STATE AND OPEN-COLLECTOR OUTPUTS | Texas-Instruments | DL | 48 | -40°C | 85°C | 161 K |
| SN74ABTE16246DLR | 11-BIT INCIDENT-WAVE SWITCHING BUS TRANSCEIVERS WITH 3-STATE AND OPEN-COLLECTOR OUTPUTS | Texas-Instruments | DL | 48 | -40°C | 85°C | 161 K |
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