Electronic component: | Description: | Manuf. | Package | Pins | T°min | T°max | Datasheet |
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HD74ACT182 | Look-Ahead Carry Generator | distributor | - | - | - | - | 65 K |
M48T18-100PC1 | 64K (8K X 8) TIMEKEEPER SRAM | SGS-Thomson-Microelectronics | - | - | - | - | 148 K |
SM4T18A | TRANSIL | SGS-Thomson-Microelectronics | - | - | - | - | 126 K |
SM4T18CA | TRANSIL | SGS-Thomson-Microelectronics | - | - | - | - | 126 K |
SN74ABT18646PM | SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS | Texas-Instruments | PM | 64 | -40°C | 85°C | 145 K |
SN74ABT18646PM | SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS | Texas-Instruments | PM | 64 | -40°C | 85°C | 145 K |
SN74ABT18646PM | SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS | Texas-Instruments | PM | 64 | -40°C | 85°C | 145 K |
SN74ABT18652PM | SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS | Texas-Instruments | PM | 64 | -40°C | 85°C | 169 K |
SN74ABT18652PM | SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS | Texas-Instruments | PM | 64 | -40°C | 85°C | 169 K |
SN74LVT18512DGGR | 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS | Texas-Instruments | DGG | 64 | -40°C | 85°C | 544 K |
SN74LVT18512DGGR | 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS | Texas-Instruments | DGG | 64 | -40°C | 85°C | 544 K |
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