| Electronic component: | Description: | Manuf. | Package | Pins | T°min | T°max | Datasheet |
|---|
| SN74ABTE16246DL | 11-BIT INCIDENT-WAVE SWITCHING BUS TRANSCEIVERS WITH 3-STATE AND OPEN-COLLECTOR OUTPUTS | Texas-Instruments | DL | 48 | -40°C | 85°C | 161 K |
| SN74ABTE16246DLR | 11-BIT INCIDENT-WAVE SWITCHING BUS TRANSCEIVERS WITH 3-STATE AND OPEN-COLLECTOR OUTPUTS | Texas-Instruments | DL | 48 | -40°C | 85°C | 161 K |
| SN74GTL16612ADGGR | 18-BIT LVTTL-TO-GTL/GTLPLUS UNIVERSAL BUS TRANSCEIVERS | Texas-Instruments | DGG | 56 | -40°C | 85°C | 203 K |
| SN74GTL16612ADLR | 18-BIT LVTTL-TO-GTL/GTLPLUS UNIVERSAL BUS TRANSCEIVERS | Texas-Instruments | DL | 56 | -40°C | 85°C | 203 K |
| SNJ54ABT8245FK | SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS | Texas-Instruments | FK | 28 | -55°C | 125°C | 342 K |
| SNJ54ABT8245JT | SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS | Texas-Instruments | JT | 24 | -55°C | 125°C | 342 K |
| SNJ54ABT8543FK | SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANCEIVERS | Texas-Instruments | FK | 28 | -55°C | 125°C | 357 K |
| SNJ54ABT8543JT | SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANCEIVERS | Texas-Instruments | JT | 28 | -55°C | 125°C | 357 K |
| SNJ54ABT8543JT | SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANCEIVERS | Texas-Instruments | JT | 28 | -55°C | 125°C | 357 K |
| SNJ54ABTH18502AHV | SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS | Texas-Instruments | HV | 68 | -55°C | 125°C | 549 K |
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